DocumentCode
1476134
Title
SNS junction on Nb-Ti base for microwave circuits
Author
Schubert, M. ; Fritzsch, L. ; Wende, G. ; Meyer, H.-G.
Author_Institution
Cryoelectron. Div., Inst. for Phys. High Technol., Jena, Germany
Volume
11
Issue
1
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
1066
Lastpage
1069
Abstract
Superconductor-normal metal-superconductor (SNS) junctions are well-suited for large-scale integrated superconducting circuits. Potential applications are programmable voltage standards, digital-to-analog converters and large-scale RSFQ circuits. The application of SNS junctions provides some advantages, e.g. a simplified fabrication technology and reduced parasitic inductances. But it requires a technological process with dimensions down to the submicrometer region to achieve sufficiently high characteristic voltages ICRN. In our process the normal metal interlayer is titanium. Therefore the sidewall insulation of the junctions can be made by anodization, as it is known from the Nb-Al technology. Nb-Ti-Nb Josephson junctions and junction arrays were fabricated down to the submicrometer range with ICRN values up to 87 microvolt depending on the titanium thickness. Their measured critical currents have a small spread of about 10 percent. Shapiro steps are observed under the influence of microwave irradiation. For the application of such junctions in a programmable Josephson voltage standard a new type of microwave circuit using coplanar strips is proposed and successfully tested in 10 V SIS circuits
Keywords
Josephson effect; anodisation; critical currents; measurement standards; niobium; superconducting arrays; superconducting integrated circuits; superconducting microwave devices; superconductor-normal-superconductor devices; titanium; voltage measurement; 10 V; Josephson junction array; Nb-Ti-Nb; SNS junction; Shapiro step; anodization; characteristic voltage; coplanar strip; critical current; fabrication technology; microwave circuit; microwave irradiation; parasitic inductance; programmable Josephson voltage standard; superconducting integrated circuit; Circuit testing; Digital-analog conversion; Integrated circuit technology; Josephson junctions; Large scale integration; Microwave circuits; Superconducting devices; Superconducting microwave devices; Titanium; Voltage;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.919531
Filename
919531
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