Accuracy issues in surface resistance measurements of high temperature superconductors using dielectric resonators

Author

Mazierska, Janina ; Wilker, Charles

Author_Institution

Dept. of Electr. & Comput. Eng., James Cook Univ. of North Queensland, Townsville, Qld., Australia

Volume

11

Issue

1

fYear

2001

fDate

3/1/2001 12:00:00 AM

Firstpage

3217

Lastpage

3225

Abstract

Reproducible and accurate measurements of the surface resistance of high temperature superconductors are essential for the development and commercialization of the next generation of high performance cryoelectronic systems. Dielectric resonators are the best, most accurate technique for this measurement and have been suggested for the international standard technique. This paper discusses trade-offs amongst the various types of dielectric resonators including choices of the dielectric rod, the metallic enclosure, the electrical measurements of Q-factor, resonant frequency and coupling coefficients, and other issues to ensure reproducible and accurate measurements

Keywords

Q-factor measurement; dielectric resonators; electrical conductivity measurement; high-frequency effects; high-temperature superconductors; microwave measurement; surface conductivity; Q-factor; coupling coefficients; dielectric resonators; dielectric rod; electrical measurements; high temperature superconductors; international standard technique; metallic enclosure; reproducible accurate measurements; resonant frequency; surface resistance measurements; trade-offs; Commercialization; Dielectric measurements; Electric variables measurement; Electrical resistance measurement; Frequency measurement; High temperature superconductors; Measurement standards; Q factor; Resonant frequency; Surface resistance;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.919749

Filename

919749