Effect of head skew on edge erasure and transition noise at submicron recording track width

Author

Lam, Terence T. ; Zhu, Jian-Gang ; Tong, Hua-Ching

Author_Institution

Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA

Volume

33

Issue

5

fYear

1997

fDate

9/1/1997 12:00:00 AM

Firstpage

2719

Lastpage

2721

Abstract

Cross track transition noise profiles and erase band widths were measured on a spin-stand using a 1 μm wide focus ion beam trimmed inductive head, at different skew angles. At a 20° skew angle, large asymmetry about the track center in the noise profiles is observed, which is attributed to the self-overwriting of transitions near the edge on the side of the track that has a wider erase band. This self-overwriting at the track edge broadens transitions and leads to track edge percolation at high densities. This causes an effective track width reduction which shows up as an increase in the erase band width in the erase profile measurement

Keywords

hard discs; magnetic heads; magnetic recording noise; magnetic thin film devices; 1 mum; cross track transition noise profiles; edge erasure; erase band widths; erase profile measurement; focus ion beam trimmed inductive head; head skew; noise profile asymmetry; piezoelectric head positioner; rigid disk drives; self-overwriting; skew angles; spin-stand; submicron recording track width; track edge percolation; track width reduction; transition broadening; transition noise; Background noise; Bones; Degradation; Disk drives; Disk recording; Electric variables measurement; Ion beams; Magnetic heads; Noise measurement; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.617456

Filename

617456