Numerical calculation of critical current in Bi-2223 stacked tapes

Author

Nah, Wansoo ; Kang, Joonsun ; Choi, Seyong ; Park, Il-Han ; Joo, Jinho ; Kwon, Young-Kil ; Oh, Sang-Soo ; Ryu, Kang-Sik ; Paasi, Jaakko ; Lehtonen, Jorma

Author_Institution

Sch. of Electr. & Comput. Eng., Sungkyunkwan Univ., Suwon, South Korea

Volume

11

Issue

1

fYear

2001

fDate

3/1/2001 12:00:00 AM

Firstpage

3908

Lastpage

3911

Abstract

As we stack HTS tapes, the critical current of stacked tapes is much less than the total summation of the critical current of each tape. This is mainly due to self magnetic field effects, and its behavior has been analyzed by load line or numerical methods with some assumptions. In this paper, we propose a simple numerical model to calculate the critical current of stacked tapes more exactly. To do this, we measured J_c-B curves of a HTS tape for various values of external magnetic fields and the angles between the magnetic field and the tape surface. Using this experimental data, the current density distribution in the cross section of stacked tapes is calculated numerically and the results are compared to both experimental values and the ones from load line analysis method, calculated simply by assuming uniform current density across the tapes

Keywords

bismuth compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; strontium compounds; superconducting tapes; Bi-2223 stacked tapes; Bi₂Sr₂Ca₂Cu₃O₁₀; critical current; current density distribution; high temperature superconductor; load line; numerical methods; self magnetic field effects; Critical current; Current density; Degradation; High temperature superconductors; Magnetic analysis; Magnetic field measurement; Magnetic fields; Numerical analysis; Numerical models; Stacking;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.919924

Filename

919924