Experimental Demonstration of the Extended Probe Instrument Calibration (EPIC) Technique

A chamber calibration technique for spherical near-field antenna measurements proposed by Pogorzelski is experimentally demonstrated. The chamber was purposely degraded by introducing a metal plate situated so as to produce a strong specular reflection from the antenna under test to the chamber probe. The effects of this artifact were easily observed in the raw data. The chamber with the artifact was calibrated using an open ended waveguide calibration antenna and the resulting calibration coefficients were used to correct the raw measurement producing a result very similar to the measurement carried out in the undegraded chamber over about 30 to 35 dB of dynamic range.