• DocumentCode
    1479082
  • Title

    Transient response of 50 KiloAmp Y-Ba-Cu-O rings and ring pairs to pulsed magnetic fields

  • Author

    Askew, Thomas R. ; Cha, Yung S.

  • Author_Institution
    Kalamazoo Coll., MI, USA
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    3947
  • Lastpage
    3950
  • Abstract
    Shielding current limits and magnetic diffusion characteristics have been measured at 77 K in large-grain YBCO rings with oriented microstructures. The samples are surrounded by a drive coil that can achieve magnetic fields in excess of 1 Tesla and induce currents in excess of 50 kA when driven by a current pulse of a few msec duration. Simultaneous magnetic measurements with a Rogowski coil and a Hall probe allow determination of the induced current in the sample and the field in the center of the sample. These measurements show that field penetration occurs in a complex way that includes delays and transient effects caused by magnetic diffusion and sample heating. Dramatic threshold effects are observed that are probably related to a creep-flow transition coupled with local heating effects. Geometric effects are investigated using a single drive coil and a pair of YBCO rings with various spacings. A test geometry equivalent to a simple penetration-type inductive fault current limiter is used; the experimental results are therefore of interest for design and characterization of these devices
  • Keywords
    barium compounds; fault current limiters; flux creep; high-temperature superconductors; magnetic shielding; superconducting devices; transient response; yttrium compounds; 50 kA; 77 K; HTSC; Hall probe; Rogowski coil; Y-Ba-Cu-O; Y-Ba-Cu-O rings; characterization; creep-flow transition; delays; design; drive coil; field penetration; geometric effects; induced current; local heating effects; magnetic diffusion; magnetic diffusion characteristics; oriented microstructures; pulsed magnetic fields; ring pairs; sample heating; shielding current limits; simple penetration-type inductive fault current limiter; test geometry; transient response; Coils; Current measurement; Hall effect devices; Heating; Magnetic field measurement; Magnetic shielding; Magnetic variables measurement; Microstructure; Transient response; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.919941
  • Filename
    919941