DocumentCode
1481178
Title
A technology-independent approach to custom analog cell generation
Author
Mehranfar, Stacy W.
Author_Institution
Hughes Aircraft Co., Canoga Park, CA, USA
Volume
26
Issue
3
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
386
Lastpage
393
Abstract
STAT (schematic to artwork transistor), a set of software tools designed to generate full-custom layouts of analog cells from arbitrary schematic topologies in any IC technology, is described. The system enables the circuit designer to annotate the schematic with component matching and symmetry relationships. Software subroutines are then used to generate device artwork. The placement program implements algorithms in which groups of related components are placed first so that annotated layout constraints are preserved. A novel placement method is offered which recognizes that analog schematic topologies often reflect desirable layout configurations. A flexible multilayer cell-level router has been developed to complete the device interconnection. The STAT system functions in either a polygon or symbolic layout environment. The symbolic layout allows design-rule and technology changes to be made easily and is designed to interface with a commercial compaction program to produce the final layout
Keywords
analogue circuits; circuit layout CAD; integrated circuit technology; network topology; software tools; IC technology; STAT; compaction program; component matching; custom analog cell generation; device artwork; device interconnection; full-custom layouts; layout configurations; multilayer cell-level router; placement program; polygon; schematic to artwork transistor; schematic topologies; software tools; symbolic layout environment; symmetry relationships; technology-independent approach; Aircraft; Algorithms; Analog circuits; Analog integrated circuits; CMOS technology; Circuit topology; Integrated circuit layout; Nonhomogeneous media; Software design; Software tools;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.75018
Filename
75018
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