• DocumentCode
    1481493
  • Title

    Quench development and ultimate normal zone propagation “velocity” in superconductors under fast current change

  • Author

    Vysotsky, V.S. ; Ilyin, Yu.A. ; Rakhmanov, A.L. ; Funaki, K. ; Takeo, M. ; Shimohata, K. ; Nakamura, S. ; Yamada, M. ; Hasegawa, K.

  • Author_Institution
    Kurchatov (I.V.) Inst. of Atomic Energy, Moscow, Russia
  • Volume
    11
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    2118
  • Lastpage
    2121
  • Abstract
    Normal zone evolution or quench development is a major feature for resistive type fault current limiters design. We studied quench development under fast current rise in several samples of multifilament superconducting wires with a highly resistive matrix. At very fast current rise rates simultaneous quench of the entire sample takes place. It may be described by a characteristic time of a quench. We found that at the highest current rise rate this time is the same for samples with different lengths and cooling conditions made from the same wire. Apparent normal zone “velocity” determined by this time is an ultimate velocity for a given length of a superconducting wire of certain type. We present experimental data about quench development under fast current rise and provide the theoretical estimations of quench parameters
  • Keywords
    fault current limiters; multifilamentary superconductors; superconducting devices; cooling conditions; fast current change; highly resistive matrix; multifilament superconducting wires; normal zone evolution; quench development; resistive type fault current limiters; superconductors; ultimate normal zone propagation velocity; very fast current rise rates; Cooling; Estimation theory; Fault current limiters; Lead; Multifilamentary superconductors; Parameter estimation; Scattering; Superconducting filaments and wires; Superconductivity; Testing;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.920275
  • Filename
    920275