• DocumentCode
    1482328
  • Title

    Preparation and magnetic properties of Fe-Ti-N thin films

  • Author

    Matsumoto, M. ; Morisako, A. ; Takei, S. ; Mutou, Y.

  • Author_Institution
    Dept. of Inf. Eng., Shinshu Univ., Nagano, Japan
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • Firstpage
    2851
  • Lastpage
    2853
  • Abstract
    In this paper the dependence of the magnetic properties of Fe-Ti-N thin films on partial nitrogen pressure (PN2/PTotal) during sputtering were studied. Fe-Ti-N thin films were prepared with a dc magnetron reactive sputtering apparatus, using a composite type of target in Ar and N2 mixed gas. The crystal structure and magnetic properties of the films were investigated. A single α-Fe (110) peak appeared at various partial nitrogen pressure (PN2/PTotal). When PN,sub>2/PTotal was increased, the width of α-Fe (110) peak became broader. The α-Fe (110) peak shifted to lower angle direction, and the maximum value of the lattice constant was about 2.93 Å at PN2/PTotal in the range of 2.5 ~ 5 %. The value of coercivity (Hc) was 26 Oe, and the value of the saturation magnetization (Ms) was about 1400 emu/cc at PN2/PTotal of 0 %. The minimum value of Hc was 2.4 Oe at easy magnetization direction, and 1.35 Oe at hard magnetization direction at PN2/PTotal of 2.5 %. The Ms of films increased at PN2/PTotal in the range of 2 ~ 5 %. Soft magnetic properties were obtained at PN2/PTotal of 2.5 %.
  • Keywords
    coercive force; ferromagnetic materials; iron compounds; magnetic thin films; magnetisation; soft magnetic materials; sputter deposition; titanium compounds; DC magnetron reactive sputtering; Fe-Ti-N; Fe-Ti-N thin film; coercivity; crystal structure; lattice constant; partial nitrogen pressure; saturation magnetization; soft magnetic properties; Argon; Coercive force; Lattices; Magnetic films; Magnetic properties; Nitrogen; Saturation magnetization; Soft magnetic materials; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.617753
  • Filename
    617753