• DocumentCode
    1482421
  • Title

    Placement of power quality monitors using enhanced genetic algorithm and wavelet transform

  • Author

    Hong, Ying-Yi ; Chen, Y.Y.

  • Author_Institution
    Dept. of Electr. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
  • Volume
    5
  • Issue
    4
  • fYear
    2011
  • fDate
    4/1/2011 12:00:00 AM
  • Firstpage
    461
  • Lastpage
    466
  • Abstract
    Power quality (PQ) problems include harmonics, voltage flicker, three-phase imbalance, voltage swell/sag, interruption, switching transient and so on. Identification of accurate location and occurrence time of PQ problem is important for understanding the underlying cause and to prevent future occurrence. This study presents a new method for placement of power quality measurement facilities to identify PQ problems. The power harmonics and capacitor switching transients are used as disturbance sources for illustration. The proposed method first utilises harmonic voltages and wavelet coefficients as PQ features. An enhanced genetic algorithm is proposed for solving the modified K-means clustering to place PQ measurement monitors. Simulation results for an 18-bus system show that the proposed approach is effective in comparison with the existing approaches.
  • Keywords
    genetic algorithms; pattern clustering; power supply quality; wavelet transforms; 18-bus system; capacitor switching transients; disturbance sources; genetic algorithm enhancement; harmonic voltages; modified K-means clustering; power harmonics; power quality measurement monitoring; three-phase imbalance; voltage flicker; voltage swell-sag; wavelet transform;
  • fLanguage
    English
  • Journal_Title
    Generation, Transmission & Distribution, IET
  • Publisher
    iet
  • ISSN
    1751-8687
  • Type

    jour

  • DOI
    10.1049/iet-gtd.2010.0397
  • Filename
    5739623