DocumentCode
1482421
Title
Placement of power quality monitors using enhanced genetic algorithm and wavelet transform
Author
Hong, Ying-Yi ; Chen, Y.Y.
Author_Institution
Dept. of Electr. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
Volume
5
Issue
4
fYear
2011
fDate
4/1/2011 12:00:00 AM
Firstpage
461
Lastpage
466
Abstract
Power quality (PQ) problems include harmonics, voltage flicker, three-phase imbalance, voltage swell/sag, interruption, switching transient and so on. Identification of accurate location and occurrence time of PQ problem is important for understanding the underlying cause and to prevent future occurrence. This study presents a new method for placement of power quality measurement facilities to identify PQ problems. The power harmonics and capacitor switching transients are used as disturbance sources for illustration. The proposed method first utilises harmonic voltages and wavelet coefficients as PQ features. An enhanced genetic algorithm is proposed for solving the modified K-means clustering to place PQ measurement monitors. Simulation results for an 18-bus system show that the proposed approach is effective in comparison with the existing approaches.
Keywords
genetic algorithms; pattern clustering; power supply quality; wavelet transforms; 18-bus system; capacitor switching transients; disturbance sources; genetic algorithm enhancement; harmonic voltages; modified K-means clustering; power harmonics; power quality measurement monitoring; three-phase imbalance; voltage flicker; voltage swell-sag; wavelet transform;
fLanguage
English
Journal_Title
Generation, Transmission & Distribution, IET
Publisher
iet
ISSN
1751-8687
Type
jour
DOI
10.1049/iet-gtd.2010.0397
Filename
5739623
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