• DocumentCode
    1482972
  • Title

    Body-bias effect on drain-induced barrier lowering in sphere-shaped-recess cell-array transistor

  • Author

    Kim, Kunsu ; Jung, K.-H. ; Moon, J.-S. ; Roh, Youngsu

  • Volume
    48
  • Issue
    7
  • fYear
    2012
  • Firstpage
    366
  • Lastpage
    367
  • Abstract
    Sphere-shaped-recess cell-array transistors (S-RCATs) have been playing a major role in DRAMs on the 70 nm design-rule. The S-RCAT has a recessed-channel structure that produces small drain-induced barrier lowering (DIBL) and large body-bias effect. The temperature and body-bias dependence of DIBL is studied for a S-RCAT. Negative DIBL is peculiarly observed under certain conditions. It is assumed that the negative DIBL originates from the increase of body-bias effect with increasing drain bias and temperature.
  • Keywords
    DRAM chips; integrated circuit design; transistors; DIBL; DRAM; S-RCAT; body-bias effect; drain bias; drain-induced barrier lowering; recessed-channel structure; size 70 nm; sphere-shaped recess cell-array transistor;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2011.4032
  • Filename
    6177768