• DocumentCode
    1487733
  • Title

    Doping Asymmetry Problem in ZnO: Current Status and Outlook

  • Author

    Avrutin, Vitaliy ; Silversmith, Donald J. ; Morkoç, Hadis

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Virginia Commonwealth Univ., Richmond, VA, USA
  • Volume
    98
  • Issue
    7
  • fYear
    2010
  • fDate
    7/1/2010 12:00:00 AM
  • Firstpage
    1269
  • Lastpage
    1280
  • Abstract
    ZnO has gained considerable interest recently as a promising material for a variety of applications. To a large extent, the renewed interest in ZnO is fuelled by its wide direct band gap (3.3 eV at room temperature) and large exciton binding energy (60 meV) making this material, when alloyed with, e.g., Cd and Mg, especially attractive for light emitters in the blue/ultraviolet (UV) spectral region. Unfortunately, as with other wide-gap semiconductors, ZnO suffers from the doping asymmetry problem, in that the n-type conductivity can be obtained rather easily, but p-type doping proved to be a formidable challenge. This doping asymmetry problem (also dubbed as the p-type problem in ZnO) is preventing applications of ZnO in light-emitting diodes and potential laser diodes. In this paper, we provide a critical review of the current experimental efforts focused on achieving p-type ZnO and discuss the proposed approaches which could possibly be used to overcome the p-type problem.
  • Keywords
    II-VI semiconductors; crystal symmetry; excitons; light emitting diodes; semiconductor doping; ultraviolet spectra; wide band gap semiconductors; zinc compounds; ZnO; blue-ultraviolet spectral region; doping asymmetry problem; electron volt energy 3.3 eV; electron volt energy 60 meV; exciton binding energy; laser diodes; light emitting diodes; n-type conductivity; temperature 293 K to 298 K; wide direct band gap semiconductors; Conducting materials; Conductivity; Excitons; Impurities; Light emitting diodes; Photonic band gap; Semiconductor device doping; Thin film transistors; Zinc compounds; Zinc oxide; $p$-type; Impurities; ZnO; point defects;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2010.2043330
  • Filename
    5462903