• DocumentCode
    1488420
  • Title

    Design of an RF Transmit/Receive Switch Using LDMOSFETs With High Power Capability and Low Insertion Loss

  • Author

    Hu, Chih-Min ; Hung, Chung-Yu ; Chu, Chun-Hsueh ; Chang, Da-Chiang ; Huang, Chih-Fang ; Gong, Jeng ; Chen, Ching-Yu

  • Author_Institution
    Dept. of Electron. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • Volume
    58
  • Issue
    6
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    1722
  • Lastpage
    1727
  • Abstract
    This paper presents, for the first time, the study of the application of a lateral diffused metal-oxide-semiconductor field-effect transistor (LDMOSFET) in a common-gate configuration to radio-frequency (RF) transmit/receive (T/R) switching circuits. A single-pole double-throw (SPDT) 900-MHz T/R switch is implemented using 0.25-LDMOSFET foundry technology. Measured results show that our switching circuit can achieve a low insertion loss of 0.82 dB and a high power handling capability of 27 dBm. This result is promising in integrating power management integrated circuits, RF power amplifiers, and switching circuits in a single chip, based on LDMOSFET technology, to realize an RF transmit front-end system-on-chip solution.
  • Keywords
    UHF field effect transistors; UHF integrated circuits; UHF power amplifiers; field effect transistor switches; power integrated circuits; switching circuits; system-on-chip; LDMOSFET; RF power amplifier; RF transmit front-end system-on-chip solution; RF transmit-receive switch; SPDT; T-R switching circuit; common-gate configuration; frequency 900 MHz; high power handling capability; integrating power management integrated circuit; low insertion loss; module lateral diffused metal-oxide-semiconductor field- effect transistor; radio-frequency; single-pole double-throw; size 0.25 mum; Logic gates; Radio frequency; Silicon; Substrates; Switches; Switching circuits; Transistors; Lateral diffused metal–oxide–semiconductor (LDMOS); radio-frequency (RF) switches;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2127481
  • Filename
    5742688