Time domain characterization of thin film head/media systems

Author

Brittenham, Steve

Author_Institution

Hewlett-Packard, Boise, ID, USA

Volume

24

Issue

6

fYear

1988

fDate

11/1/1988 12:00:00 AM

Firstpage

2949

Lastpage

2954

Abstract

With thin-film head/media systems, frequency-domain parametric measurements (SNR, resolution, decibel overwrite, etc.) often demonstrate poor correlation with actual disk-drive phase margin results. Superposition modeling and direct time-domain measurements are required to understand these systems better. Several techniques are discussed: time-domain quantification of individual read and media noise, aggregate noise and offset deconvolution from phase margin graphs, and time-domain writeability measurements. Applications of these techniques include characterization of phenomena unique to thin-film systems, optimization of disk-drive electronics using these systems, and the creation of improved component and drive production tests

Keywords

magnetic disc storage; magnetic heads; magnetic thin film devices; aggregate noise; direct time-domain measurements; disk-drive electronics; disk-drive phase margin; drive production tests; media noise; offset deconvolution; phase margin graphs; thin film head/media systems; time-domain writeability; Aggregates; Deconvolution; Electronic equipment testing; Frequency measurement; Noise measurement; Phase measurement; Phase noise; Signal to noise ratio; Time domain analysis; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.92298

Filename

92298