• DocumentCode
    1492418
  • Title

    Multiple-valued static CMOS memory cell

  • Author

    Çilingiroglu, Ugur ; Özelci, Yaman

  • Author_Institution
    Dept. of Electron. & Commun. Eng., Istanbul Tech. Univ., Turkey
  • Volume
    48
  • Issue
    3
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    282
  • Lastpage
    290
  • Abstract
    The conventional flip-flop core is generalized to multistability in full static CMOS without compromising the standard binary CMOS features such as ratioless device sizing, negligible static power consumption, and wide noise margins. The proposed multiple-level cell is built with eight devices for three-level operation and necessitates four more devices for each additional level. It can be arranged with a proper address scheme to function as a RAM cell, D-latch, or synaptic memory. Experimental work verifies four-level operation with 3-V supply. Simulations indicate the possibility of six-level storage in 5-V operation. The cell retains noise margins one threshold voltage wide even at such high-level operation. This is made possible by exploiting the dynamic hysteresis associated with the transfer characteristic of an inverter operating with very low rail-to-rail voltage
  • Keywords
    CMOS memory circuits; flip-flops; low-power electronics; multivalued logic circuits; random-access storage; 3 V; 5 V; D-latch; RAM; dynamic hysteresis; flip-flop; inverter; low-power circuit; multiple-valued static CMOS memory cell; noise margin; synaptic memory; threshold voltage; transfer characteristics; CMOS logic circuits; Flip-flops; Fuzzy logic; Hysteresis; Inverters; Logic devices; Neural networks; Random access memory; Read-write memory; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7130
  • Type

    jour

  • DOI
    10.1109/82.924070
  • Filename
    924070