• DocumentCode
    1493502
  • Title

    Application of neural fuzzy network to pyrometer correction and temperature control in rapid thermal processing

  • Author

    Lai, Jiun-Hong ; Lin, Chin-Teng

  • Author_Institution
    Dept. of Electron. & Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    7
  • Issue
    2
  • fYear
    1999
  • fDate
    4/1/1999 12:00:00 AM
  • Firstpage
    160
  • Lastpage
    175
  • Abstract
    Temperature measurement and control are two difficult problems in the rapid thermal processing (RTP) system. For many applications such as rapid thermal processing chemical vapor deposition (RTCVD) and rapid thermal oxidation (RTO), large changes in wafer emissivity can occur during film growing, leading to erroneous temperature measurements with a single wavelength pyrometer. The error in the inferred temperature will affect the temperature control of the RTP system. In order to correct the temperature reading of the pyrometer, a neural fuzzy network is used to predict the emissivity changes for the compensation of measured temperature. As for the temperature control, to overcome ill performance of the temperature tracking system due to the inaccuracy of the identified model, another neural fuzzy network is used in the RTP system for learning inverse control simultaneously. The key advantage of neural fuzzy approach over traditional ones lies on that the approach does not require a mathematical description of the system while performing pyrometer correction and temperature control. Simulation results show that the adopted neural fuzzy networks can not only correct the pyrometer reading accurately, but also be able to track a temperature trajectory very well
  • Keywords
    compensation; fuzzy neural nets; learning (artificial intelligence); pyrometers; rapid thermal processing; temperature control; temperature measurement; chemical vapor deposition; film growing; inferred temperature; learning inverse control; neural fuzzy network; pyrometer correction; rapid thermal oxidation; rapid thermal processing; wafer emissivity; Chemical vapor deposition; Control systems; Error correction; Fuzzy control; Fuzzy neural networks; Fuzzy systems; Oxidation; Rapid thermal processing; Temperature control; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Fuzzy Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-6706
  • Type

    jour

  • DOI
    10.1109/91.755398
  • Filename
    755398