• DocumentCode
    1494480
  • Title

    An Accumulating Pixel Array Detector for Single-Bunch Synchrotron Experiments

  • Author

    Koerner, Lucas J. ; Tate, Mark W. ; Gruner, Sol M.

  • Author_Institution
    Dept. of Phys., Cornell Univ., Ithaca, NY, USA
  • Volume
    56
  • Issue
    5
  • fYear
    2009
  • Firstpage
    2835
  • Lastpage
    2842
  • Abstract
    We describe the development of a CMOS read-out chip for an X-ray pixel array detector that accumulates into analog storage elements with time resolution typical of synchrotron bunch spacings. Each pixel contains multiple analog storage elements to allow capture of full-frame images at submicrosecond separation. Additionally, each storage element is re-addressable, which allows accumulation of signal from temporally distinct acquisition windows. Test results show the ability to slew and settle the equivalent of 650 8-keV x-rays (1.21 Me-) in less than 100 ns. The detector RMS read-noise was measured to be 2350 e- and grows with the square-root of the number of accumulations with a coefficient of 415 e- (equivalent to 1.07 and 0.19 8-keV x-rays respectively). The saturation value for each storage element, in terms of 8 keV x-rays, was measured to exceed 1880 x-rays (6.42 Me-). The complete detector is anticipated to contain around 400 times 200 pixels with pixel size near 150 mum times 150 mum. Possible experimental applications include study of material failures, transient phase transformations, and high-speed X-radiography.
  • Keywords
    CMOS analogue integrated circuits; X-ray detection; position sensitive particle detectors; readout electronics; CMOS analog integrated circuits; CMOS read-out chip; X-ray pixel array detector; analog storage elements; detector RMS read-noise; high-speed X-radiography; single-bunch synchrotron experiments; transient phase transformations; Image storage; Light sources; Pixel; Sensor arrays; Signal resolution; Synchrotrons; Timing; X-ray detection; X-ray detectors; X-ray imaging; CMOS analog integrated circuits; X-ray detectors; X-ray image sensors; switched capacitor circuits;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2028733
  • Filename
    5280495