• DocumentCode
    1494888
  • Title

    Experiment of filed-effect transistor with a channel made of NbN granular thin film

  • Author

    Sugahara, M. ; Yoshikawa, N. ; Murakami, T.

  • Author_Institution
    Fac. of Eng., Yokohama Nat. Lab., Japan
  • Volume
    25
  • Issue
    2
  • fYear
    1989
  • fDate
    3/1/1989 12:00:00 AM
  • Firstpage
    1270
  • Lastpage
    1273
  • Abstract
    The authors describe an experimental study of the effect of an electric field on a granular superconducting thin film using a three-terminal device which has the structure of a field-effect transistor, with the channel made of NbN granular thin film. When the gate voltage is varied at low temperature, the channel resistance shows a cyclical variation of more than one cycle. The maximum resistance variation observed at 4.2 K is about 40% . The voltage period for the resistance variation seems to correspond to the induction of the electric pair charge, 2e, on a grain. It is concluded that this result is due to a new microscopic quantum effect dual to the Josephson effect and could lead to a novel three-terminal superconductor device
  • Keywords
    field effect transistors; niobium compounds; superconducting junction devices; superconducting thin films; Josephson effect; NbN granular thin film; channel resistance; electric field; electric pair charge; filed-effect transistor; gate voltage; maximum resistance variation; microscopic quantum effect; three-terminal device; voltage period; Electric resistance; FETs; Granular superconductors; Josephson effect; Microscopy; Superconducting thin films; Temperature; Thin film devices; Thin film transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.92527
  • Filename
    92527