• DocumentCode
    1495262
  • Title

    On Correctable Errors of Binary Linear Codes

  • Author

    Yasunaga, Kenji ; Fujiwara, Toru

  • Author_Institution
    Dept. of Math. & Comput. Sci., Tokyo Inst. of Technol., Tokyo, Japan
  • Volume
    56
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    2537
  • Lastpage
    2548
  • Abstract
    The error correction capability of binary linear codes with minimum distance decoding, in particular the number of correctable/uncorrectable errors, is investigated for general linear codes and the first-order Reed-Muller codes. For linear codes, a lower bound on the number of uncorrectable errors is derived. The bound for uncorrectable errors with a weight of half the minimum distance asymptotically coincides with the corresponding upper bound for Reed-Muller codes and random linear codes. For the first-order Reed-Muller codes, the number of correctable/uncorrectable errors with a weight of half the minimum distance plus one is determined. This result is equivalent to deriving the number of Boolean functions of m variables with nonlinearity 2 m-2+1 . The monotone error structure and its related notions larger half and trial set, which were introduced by Helleseth, Klÿve, and Levenshtein, are mainly used to derive the results.
  • Keywords
    Boolean functions; Reed-Muller codes; binary codes; error correction; linear codes; random codes; Boolean functions; binary linear codes; correctable errors; error correction; first-order Reed-Muller codes; general linear codes; lower bound; minimum distance decoding; monotone error structure; random linear codes; Boolean functions; Error analysis; Error correction; Error correction codes; Hamming weight; Linear code; Maximum likelihood decoding; Performance analysis; Upper bound; Vectors; Boolean function; Reed–Muller code; error correction capability; monotone error structure; nonlinearity; trial set;
  • fLanguage
    English
  • Journal_Title
    Information Theory, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9448
  • Type

    jour

  • DOI
    10.1109/TIT.2010.2046209
  • Filename
    5466534