DocumentCode
1496452
Title
A Bayesian predictive software reliability model with pseudo-failures
Author
Pham, Loan ; Pham, Hoang
Author_Institution
Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
Volume
31
Issue
3
fYear
2001
fDate
5/1/2001 12:00:00 AM
Firstpage
233
Lastpage
238
Abstract
In our previous paper (2000), a Bayesian software reliability model with stochastically decreasing hazard rate was presented. Within any given failure time interval, the hazard rate is a function of both total testing time as well as number of encountered encountered failures. In this paper, to improve the predictive performance of our previously proposed model, a pseudo-failure is inserted whenever there is a period of failure-free execution equals (1-α)th percentile of the predictive distribution for time until the next failure has passed. We apply the enhanced model with pseudo-failures inserted to actual software failure data and show it gives better results under the sum of square errors criteria compared to previous Bayesian models and other existing times between failures models
Keywords
Bayes methods; Weibull distribution; failure analysis; reliability theory; software reliability; Bayesian predictive model; Weibull distribution; hazard rate; likelihood ratios; pseudo-failures; software reliability; testing time; time between failures; Bayesian methods; Computer errors; Computer industry; Hazards; Maximum likelihood estimation; Predictive models; Software quality; Software reliability; Software testing; Weibull distribution;
fLanguage
English
Journal_Title
Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
Publisher
ieee
ISSN
1083-4427
Type
jour
DOI
10.1109/3468.925663
Filename
925663
Link To Document