• DocumentCode
    1496452
  • Title

    A Bayesian predictive software reliability model with pseudo-failures

  • Author

    Pham, Loan ; Pham, Hoang

  • Author_Institution
    Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
  • Volume
    31
  • Issue
    3
  • fYear
    2001
  • fDate
    5/1/2001 12:00:00 AM
  • Firstpage
    233
  • Lastpage
    238
  • Abstract
    In our previous paper (2000), a Bayesian software reliability model with stochastically decreasing hazard rate was presented. Within any given failure time interval, the hazard rate is a function of both total testing time as well as number of encountered encountered failures. In this paper, to improve the predictive performance of our previously proposed model, a pseudo-failure is inserted whenever there is a period of failure-free execution equals (1-α)th percentile of the predictive distribution for time until the next failure has passed. We apply the enhanced model with pseudo-failures inserted to actual software failure data and show it gives better results under the sum of square errors criteria compared to previous Bayesian models and other existing times between failures models
  • Keywords
    Bayes methods; Weibull distribution; failure analysis; reliability theory; software reliability; Bayesian predictive model; Weibull distribution; hazard rate; likelihood ratios; pseudo-failures; software reliability; testing time; time between failures; Bayesian methods; Computer errors; Computer industry; Hazards; Maximum likelihood estimation; Predictive models; Software quality; Software reliability; Software testing; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4427
  • Type

    jour

  • DOI
    10.1109/3468.925663
  • Filename
    925663