• DocumentCode
    1496515
  • Title

    Active Testing for Face Detection and Localization

  • Author

    Sznitman, Raphael ; Jedynak, Bruno

  • Author_Institution
    Dept. of Comput. Sci., Johns Hopkins Univ., Baltimore, MD, USA
  • Volume
    32
  • Issue
    10
  • fYear
    2010
  • Firstpage
    1914
  • Lastpage
    1920
  • Abstract
    We provide a novel search technique which uses a hierarchical model and a mutual information gain heuristic to efficiently prune the search space when localizing faces in images. We show exponential gains in computation over traditional sliding window approaches, while keeping similar performance levels.
  • Keywords
    face recognition; search problems; active testing; face detection; face localization; hierarchical model; mutual information gain heuristic; search technique; Active testing; coarse-to-fine search; face detection; face localization.; visual search; Algorithms; Artificial Intelligence; Face; Humans; Image Processing, Computer-Assisted; Pattern Recognition, Automated;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2010.106
  • Filename
    5467088
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1496515