• DocumentCode
    1496573
  • Title

    A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental Conditions

  • Author

    Rad, Reza ; Plusquellic, Jim ; Tehranipoor, Mohammad

  • Author_Institution
    Univ. of Maryland, Baltimore, MD, USA
  • Volume
    18
  • Issue
    12
  • fYear
    2010
  • fDate
    12/1/2010 12:00:00 AM
  • Firstpage
    1735
  • Lastpage
    1744
  • Abstract
    Trust in reference to integrated circuits addresses the concern that the design and/or fabrication of the integrated circuit (IC) may be purposely altered by an adversary. The insertion of a hardware Trojan involves a deliberate and malicious change to an IC that adds or removes functionality or reduces its reliability. Trojans are designed to disable and/or destroy the IC at some future time or they may serve to leak confidential information covertly to the adversary. Trojans can be cleverly hidden by the adversary to make it extremely difficult for chip validation processes, such as manufacturing test, to accidentally discover them. This paper investigates the sensitivity of a power supply transient signal analysis method for detecting Trojans. In particular, we focus on determining the smallest detectable Trojan, i.e., the least number of gates a Trojan may have and still be detected, using a set of process simulation models that characterize a TSMC 0.18 μm process. We also evaluate the sensitivity of our Trojan detection method in the presence of measurement noise and background switching activity.
  • Keywords
    VLSI; electronic engineering computing; integrated circuit design; integrated circuit manufacture; integrated circuit testing; invasive software; sensitivity analysis; TSMC process; Trojan detection method; background switching activity; chip validation processes; confidential information; detecting hardware trojans; integrated circuit design; integrated circuit fabrication; manufacturing test; measurement noise; power signal methods; power supply transient signal analysis method; sensitivity analysis; Fabrication; Hardware; Integrated circuit reliability; Manufacturing processes; Power supplies; Sensitivity analysis; Signal design; Signal detection; Signal processing; Testing; Hardware security; Trojan; testing; very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2029117
  • Filename
    5282505