• DocumentCode
    1498368
  • Title

    The Effects of CrV Underlayer on the Structure and Magnetic Properties of FePt Thin Film

  • Author

    Chun, DongWon ; Kim, Sungman ; Kim, Gyeungho ; Jeung, WonYoung

  • Author_Institution
    Div. of Mater. Res., Korea Inst. of Sci. & Technol., Seoul, South Korea
  • Volume
    46
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1856
  • Lastpage
    1858
  • Abstract
    An attempt is made in this study to employ vanadium containing chromium (CrV) alloy underlayer to control the microstructure and ultimately to facilitate the in-situ ordering of Fe-Pt thin film. CrV alloys with V contents ranging from 0 to 15 at% were investigated to evaluate their effects on the magnetic properties and structural modification of FePt thin film. Addition of V in Cr underlayer results in the formation of FePt L10 phase with (001) preferred orientation. Analysis of XRD and HR-TEM results reveals that the lattice expansion of Cr underlayer induced by V addition increases the lattice misfit strain between CrV underlayer and FePt magnetic layer. Consequently well aligned FePt (001) grains and in-situ ordering of FePt L10 thin film can be obtained. Magnetic property measurements show that FePt/Pt/5.8 at.%V-Cr multilayer has the maximum out-of-plane coercivity (4000 Oe) and squareness (0.95). Due to in-situ ordering, good perpendicular magnetic properties with higher coercivity and squareness were achieved from FePt/Pt/Cr94.2V5.8 multi-layers at the processing temperature of 350°C without further annealing treatment.
  • Keywords
    X-ray diffraction; chromium alloys; coercive force; iron alloys; magnetic hysteresis; magnetic multilayers; magnetic thin films; metallic thin films; platinum; platinum alloys; texture; transmission electron microscopy; vanadium alloys; (001) preferred orientation; FePt-Pt-Cr94.2V5.8; HR-TEM; L10 phase; XRD; annealing; in-situ ordering; magnetic properties; microstructure; multilayer; out-of-plane coercivity; squareness; structural modification; temperature 350 degC; thin film; underlayer; Chromium alloys; Coercive force; Lattices; Magnetic analysis; Magnetic field induced strain; Magnetic films; Magnetic properties; Microstructure; Transistors; X-ray scattering; in-situ ordering; CrV underlayer; FePt film; perpendicular magnetic recording media;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2009.2039553
  • Filename
    5467446