• DocumentCode
    1498558
  • Title

    A wafer design problem in semiconductor manufacturing for reliable customer service

  • Author

    Singh, Medini R. ; Abraham, Chacko T. ; Akella, Ramakrishna

  • Author_Institution
    Graduate Sch. of Ind. Adm., Carnegie-Mellon Univ., Pittsburgh, PA, USA
  • Volume
    13
  • Issue
    1
  • fYear
    1990
  • fDate
    3/1/1990 12:00:00 AM
  • Firstpage
    103
  • Lastpage
    108
  • Abstract
    The authors present models that explicitly take account of yield losses and show how available chip sites should be allocated among various types of chips to meet the demand of a set with the maximum probability. A key result is that the proportion of sites allocated to each chip type varies with the total number of available sites. The allocation model also provides a tradeoff curve between the total number of chip sites assigned for the production of a set and the highest attainable level of confidence in meeting the demand; this is valuable when more than one set is competing for the same resources. The influence of wafer loss and rework on the determination of job size is considered. The models presented here are particularly useful when reliable delivery of a set of chips by an impending due date is of prime concern and the fabrication line is congested
  • Keywords
    integrated circuit manufacture; semiconductor device manufacture; statistical analysis; allocation model; chip site allocation; fabrication line; job size; maximum probability; reliable customer service; semiconductor manufacturing; statistical models; wafer design problem; wafer loss; wafer rework; yield losses; Assembly; Computer aided manufacturing; Customer service; Fabrication; Manufacturing industries; Production planning; Semiconductor device manufacture; Semiconductor device modeling; Semiconductor device reliability; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.52855
  • Filename
    52855