• DocumentCode
    1498598
  • Title

    Temperature-stable voltage reference based on different threshold voltages of NMOS transistors

  • Author

    Xia, Xiang-Gen ; Xie, Lihua ; Sun, Wen ; Shi, Li-Hua

  • Author_Institution
    Nat. ASIC Syst. Eng. Res. Center, Southeast Univ., Nanjing, China
  • Volume
    3
  • Issue
    5
  • fYear
    2009
  • fDate
    10/1/2009 12:00:00 AM
  • Firstpage
    233
  • Lastpage
    238
  • Abstract
    A temperature-stable voltage reference based on threshold voltages of enhancement and depletion NMOS transistors has been presented and implemented with a 0.5 mum DPDM CMOS technology. The problem of a fixed voltage reference value is avoided by different parameter design. A significant reduce of temperature dependence of mobility is also achieved. The chip s area is 0.014 mm2. The test results show that the operation supply voltage is from 2 to 5 V, the maximum supply current is 8.24 muA, and the average reference voltage is 765 mV with an average line regulation of plusmn0.187%/V. A typical temperature coefficient of 39.2 ppm/degC for a temperature range of 0-100degC is obtained. The power-supply rejection ratio, without any filtering capacitors, is -46 dB at 100 Hz and -32 dB at 1 MHz for the smallest supply voltage.
  • Keywords
    CMOS integrated circuits; MOSFET; reference circuits; DPDM CMOS technology; NMOS transistor; current 8.24 muA; power-supply rejection ratio; size 0.5 mum; temperature 0 degC to 100 degC; temperature coefficient; temperature-stable voltage reference-based threshold voltage; voltage 2 V to 5 V; voltage 765 mV;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices & Systems, IET
  • Publisher
    iet
  • ISSN
    1751-858X
  • Type

    jour

  • DOI
    10.1049/iet-cds.2008.0292
  • Filename
    5285986