• DocumentCode
    1503924
  • Title

    A New Strategy to Estimate Local Fringe Frequencies for InSAR Phase Noise Reduction

  • Author

    Suo, Zhiyong ; Li, Zhenfang ; Bao, Zheng

  • Author_Institution
    Nat. Lab. of Radar Signal Process., Xidian Univ., Xi´´an, China
  • Volume
    7
  • Issue
    4
  • fYear
    2010
  • Firstpage
    771
  • Lastpage
    775
  • Abstract
    A new approach is presented to estimate the fringe frequencies in interferometric synthetic aperture radar (InSAR) phase image. A first-order model is usually used for fringe frequency estimation, but in steep regions or low-correlation regions, it often fails. In this letter, a prefiltered interferogram, obtained by the slope-compensated or conventional mean filter, is divided into small patches and unwrapped separately. Subsequently, we differentiate the local-phase-unwrapping results to obtain the fringe frequencies. Furthermore, the invalid fringe frequencies are eliminated by a statistical threshold. Finally, the interferogram is filtered by compensating the estimated fringe frequencies in the averaging window of the mean filter. The proposed method can obtain continuous fringe frequency estimation, and it is not constrained by the first-order model. The effectiveness of the proposed approach is verified by the simulated and real InSAR data.
  • Keywords
    frequency estimation; radar interferometry; synthetic aperture radar; InSAR phase noise reduction; first-order model; fringe frequency estimation; interferometric synthetic aperture radar phase image; local fringe frequencies estimation; prefiltered interferogram; Adaptive filters; Decorrelation; Filtering; Frequency estimation; Maximum likelihood estimation; Multiple signal classification; Phase estimation; Phase noise; Synthetic aperture radar; Synthetic aperture radar interferometry; Fringe frequency estimation; interferometry; phase noise filtering; phase unwrapping; synthetic aperture radar (SAR);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2010.2047935
  • Filename
    5473112