• DocumentCode
    1504619
  • Title

    Parameter estimation of the intensity process of self-exciting point processes using the EM algorithm

  • Author

    Mino, Hiroyuki

  • Author_Institution
    Electron. Syst. & Signals Res. Lab., Washington Univ., St. Louis, MO, USA
  • Volume
    50
  • Issue
    3
  • fYear
    2001
  • fDate
    6/1/2001 12:00:00 AM
  • Firstpage
    658
  • Lastpage
    664
  • Abstract
    This paper presents a method of estimating the parameters of intensity processes in the self-exciting point process (SEPP) with the expectation-maximization (EM) algorithm. In the present paper, the case is considered where the intensity process of SEPPs is dependent only on the latest occurrence, i.e., one-memory SEPPs, as well as where the impulse response function characterizing the intensity process is parameterized as a single exponential function having a constant coefficient that takes a positive or negative value, i.e., making it possible to model a self “-exciting” or “-inhibiting” point process. Then, an explicit formula is derived for estimating the parameters specifying the intensity process on the basis of the EM algorithm, which in this instance gives the maximum likelihood (ML) estimates without solving nonlinear optimization problems. In practical computations, the parameters of interest can be estimated from the histogram of time intervals between point events. Monte Carlo simulations illustrate the validity of the derived estimation formulas and procedures
  • Keywords
    Monte Carlo methods; data analysis; optimisation; parameter estimation; random processes; stochastic processes; transient response; EM algorithm; Monte Carlo simulation; histogram; impulse response function; maximum likelihood estimates; parameter estimation; self-exciting point processes; Electron tubes; Extraterrestrial phenomena; Histograms; History; Maximum likelihood estimation; Multidimensional systems; Parameter estimation; Physiology; Seismology;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.930437
  • Filename
    930437