A test pattern selection method for a joint bounded-distance and encoding-based decoding algorithm of binary codes [Transactions Letters]

For binary linear block codes, this letter deals with a class of decoding algorithms which utilize bounded-distance and encoding-based decodings with input sequences that are calculated from a received sequence and given test patterns. We propose a new method for selecting the test patterns by simulation. The effectiveness of the decoding algorithm whose test patterns are selected by the proposed method is also shown by simulation.