• DocumentCode
    1505245
  • Title

    Coexistence of Memristive Behaviors and Negative Capacitance Effects in Single-Crystal \\hbox {TiO}_{2} Thin-Film-Based Devices

  • Author

    Hu, P. ; Lu, J.Q. ; Wu, S.X. ; Lv, Q.B. ; Li, S.W.

  • Author_Institution
    State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-Sen Univ., Guangzhou, China
  • Volume
    33
  • Issue
    6
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    890
  • Lastpage
    892
  • Abstract
    Pt/TiO2/Nb:SrTiO3/Pt devices show pronounced bipolar multilevel resistive switching behaviors and negative capacitance effects. The active layer TiO2 was grown on Nb-doped SrTiO3 by molecular beam epitaxial technology. With the aid of forward or reverse bias, the devices can be switched to insulating or different conductive states. The devices show prominent negative capacitance effects strongly depending on the initial state of high or low resistance. The observed results may be attributed to oxygen vacancy´s migration-induced conductive state change of the TiO2 thin films and to the corresponding variation of charge lagging behind that of voltage.
  • Keywords
    memristors; molecular beam epitaxial growth; niobium; platinum; semiconductor thin films; strontium compounds; thin film devices; titanium compounds; Pt-TiO2SrTiO3:Nb-Pt; SrTiO3Nb; bipolar multilevel resistive switching behaviors; memristive coexistence; molecular beam epitaxial technology; negative ca- pacitance effects; negative capacitance effects; oxygen vacancy migration-induced conductive state change; single-crystal thin-film-based devices; Capacitance; Junctions; Metals; Nanoscale devices; Physics; Resistance; Switches; Multilevel memory state; negative capacitance; oxygen vacancy; resistive switching;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2191133
  • Filename
    6192285