• DocumentCode
    1505853
  • Title

    Polarization Control in Buried Tunnel Junction VCSELs Using a Birefringent Semiconductor/Dielectric Subwavelength Grating

  • Author

    Ortsiefer, Markus ; Görblich, Markus ; Xu, Yan ; Rönneberg, Enno ; Rosskopf, Jürgen ; Shau, Robert ; Amann, Markus-Christian

  • Author_Institution
    VERTILAS GmbH, Garching, Germany
  • Volume
    22
  • Issue
    1
  • fYear
    2010
  • Firstpage
    15
  • Lastpage
    17
  • Abstract
    We present long-wavelength InGaAlAs-InP vertical-cavity surface-emitting lasers (VCSELs) with a buried tunnel junction (BTJ) and a well-defined polarization accomplished by a semiconductor/dielectric subwavelength grating (SWG). The grating is incorporated in the inner VCSEL cavity and exhibits an effective birefringence for polarizations parallel and perpendicular to the grating grooves. Theoretical modeling leads to distinct design rules for VCSELs with grating structure that deviate from the conventional design without grating. Due to the large polarization-mode separation, lasing activity is enabled only for one polarization mode. BTJ-VCSELs with properly chosen SWG parameters show predictable and full polarization stability. In addition, the relevant device parameters such as threshold current are comparable to conventional BTJ-VCSELs.
  • Keywords
    III-V semiconductors; birefringence; calcium compounds; dielectric materials; diffraction gratings; distributed Bragg reflectors; gallium compounds; indium compounds; light polarisation; optical control; semiconductor junctions; semiconductor lasers; surface emitting lasers; wide band gap semiconductors; zinc compounds; CaF2-ZnS; InGaAlAs-InP; birefringence; birefringent semiconductor-dielectric subwavelength grating; buried tunnel junction VCSEL; polarization control; polarization-mode separation; threshold current; vertical cavity surface emitting lasers; InGaAlAs–InP; long-wavelength vertical-cavity surface-emitting laser (VCSEL); polarization control; semiconductor laser; subwavelength grating (SWG); tunnel junction;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2009.2034622
  • Filename
    5291751