• DocumentCode
    1505862
  • Title

    Performance Improvement of AlGaAs/GaAs QWIP by {\\rm NH}_{3} Plasma Treatment

  • Author

    Lee, Jheng-Han ; Chang, Che-Yu ; Li, Chang-Hung ; Lin, Shih-Yen ; Lee, Si-Chen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    48
  • Issue
    7
  • fYear
    2012
  • fDate
    7/1/2012 12:00:00 AM
  • Firstpage
    922
  • Lastpage
    926
  • Abstract
    The performance of AlGaAs/GaAs quantum well infrared photodetectors (QWIPs) with and without NH3 plasma treatment are investigated. It is demonstrated that the NH3 plasma treatment not only gets rid of the oxide defects, such as Ga2O3, As2O3, and As2O5, but also prevents the formation of oxides on the GaAs surface when exposed to atmosphere for one month. The peak responsivity of the QWIPs without NH3 plasma treatment is 0.48 A/W, and the detectivity is 3.13×109 cm-Hz1/2/W at 1.5 V and 60 K. However, the QWIP after the 10-m NH3 plasma treatment exhibits a better performance. The highest operation temperature can be increased from 60 to 90 K. At 90 K, the peak responsivity of the QWIP is 1.25 A/W and the detectivity is 3.54×109 cm-Hz1/2/W at 1.5 V.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; infrared detectors; photodetectors; plasma CVD; quantum well devices; AlGaAs-GaAs; NH3 plasma treatment; QWIP detectivity; QWIP responsivity; operation temperature; oxide defects; oxide formation; performance improvement; quantum well infrared photodetectors; temperature 60 K to 90 K; voltage 1.5 V; Dark current; Educational institutions; Gallium arsenide; Photodetectors; Plasma temperature; Surface treatment; Infrared photodetectors; plasma chemical vapor deposition (CVD); quantum well; quantum well devices;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2012.2196412
  • Filename
    6193113