Identification of discrepancy in multiresolution ADC system

New technologies of analog-to-digital converters (ADC) should improve quality of digital measurement devices. Multiresolution ADC (MRADC) based on a parallel architecture is usually used in time domain electromagnetic interference measuring systems for fast signal sampling with a sufficient dynamic range. The paper presents a technique for MRADC channel mismatch identification. The method uses the idea of the best sine fit. The offset, gain and phase discrepancy will be identified from experimental waveform. The simulation of the influence of the identified discrepancy parameters on the measured spectrum will be finally confronted with the experimental spectrum.