DocumentCode
1507165
Title
Virtually reducing product development time
Author
Hogan, T. ; Heffernan, D.
Author_Institution
Analog Devices, Limerick, Ireland
Volume
80
Issue
3
fYear
2001
fDate
6/1/2001 12:00:00 AM
Firstpage
122
Lastpage
128
Abstract
The speed at which semiconductor products are introduced to the market-place is key to the competitive success of individual companies. The authors look at the test engineering aspect of the IC and describe how a `virtual test´ can be effectively applied to reduce the overall product development time
Keywords
integrated circuit manufacture; product development; production engineering computing; production testing; virtual reality; IC manufacture; product development; product testing; semiconductor products; virtual test;
fLanguage
English
Journal_Title
Manufacturing Engineer
Publisher
iet
ISSN
0956-9944
Type
jour
DOI
10.1049/me:20010309
Filename
932123
Link To Document