DocumentCode
1509767
Title
Mixed-signal test bus, embedded core test efforts advance
Author
Modi, Mukund
Volume
16
Issue
2
fYear
1999
Firstpage
5
Lastpage
93
Keywords
Calibration; Circuit testing; Current measurement; Frequency; Impedance; Measurement standards; Pins; Semiconductor device measurement; Software testing; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1999.765189
Filename
765189
Link To Document