• DocumentCode
    1510795
  • Title

    Changes of Magnetic Anisotropy of CoPtCr Perpendicular Films Due to Ru Intermediate Layer Under High Gas Pressure

  • Author

    Xia, Weixing ; Xiao, Chuntao ; Shindo, Daisuke

  • Author_Institution
    Inst. of Multidiscipl. Res. for Adv. Mater., Tohoku Univ., Sendai, Japan
  • Volume
    46
  • Issue
    10
  • fYear
    2010
  • Firstpage
    3711
  • Lastpage
    3714
  • Abstract
    The uniaxial magnetic anisotropy K_u of CoPtCr-SiO2 granular perpendicular recording media increases when they are deposited on a Ru intermediate layer with high Ar gas pressure. In order to clarify the reason for the increase in K_u , we investigated the correlation between K_u of continuous CoPtCr film and the Ar gas pressure of the Ru layer. Six kinds of CoPtCr films with the compositions close to practical CoPtCr-SiO2 recording media were deposited on the Ru layer with the Ar gas pressure varying from 0.6 to 8.0 Pa. The increase in K_u of continuous CoPtCr films was confirmed. Through the investigation on microstructure using X-ray diffraction, we found that the stacking faults or the fraction of face center cubic (FCC) phase of CoPtCr grains were independent on the gas pressure of Ru while the ratio of hexagonal close packed (HCP) crystal constant c/a monotonously decreased with increasing gas pressure. We conclude that the increase in K_u of CoPtCr continuous film is mostly related to the decease of c/a due to high gas pressure of Ru layer.
  • Keywords
    X-ray diffraction; chromium alloys; cobalt alloys; granular materials; magnetic thin films; perpendicular magnetic anisotropy; perpendicular magnetic recording; platinum alloys; ruthenium; silicon compounds; stacking faults; CoPtCr-SiO2-Ru; X-ray diffraction; continuous film; face center cubic phase; granular perpendicular recording media; hexagonal close packed crystal constant; high gas pressure; intermediate layer; microstructure; pressure 0.6 Pa to 8.0 Pa; stacking faults; uniaxial magnetic anisotropy; Anisotropic magnetoresistance; Argon; Chromium; Magnetic anisotropy; Magnetic films; Magnetic materials; Magnetic properties; Magnetic recording; Perpendicular magnetic recording; Shape measurement; Magnetic anisotropy; magnetic films; magnetic recording;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2010.2051449
  • Filename
    5482042