• DocumentCode
    1511095
  • Title

    Commentary: inference in simple step-stress models

  • Author

    Watkins, Alan J.

  • Author_Institution
    EBMS, Univ. Coll. of Swansea, UK
  • Volume
    50
  • Issue
    1
  • fYear
    2001
  • fDate
    3/1/2001 12:00:00 AM
  • Firstpage
    36
  • Lastpage
    37
  • Abstract
    This note considers simple step-stress models with type-II censored exponential data. For two stress-levels and a log-linear link between stress and mean life, there is a reparameterization of the parameters of the negative exponential distributions, so that one can equally well work with these parameters or those in the log-linear link. From a statistical perspective, it is preferable to work with the parameters of the negative exponential distributions, since the "lack-of-memory" property of this distribution allows the analysis to be sub-divided, with ensuing simplification.
  • Keywords
    exponential distribution; inference mechanisms; life testing; accelerated life testing; exponential distribution; lack-of-memory; log-linear link; mean life; negative exponential distributions; simple step-stress models inference; statistical perspective; type-II censored exponential data; Algebra; Computer aided software engineering; Exponential distribution; Lead; Life testing; Probability density function; Stress;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.935014
  • Filename
    935014