• DocumentCode
    1513828
  • Title

    Passive Polarimetric Imagery-Based Material Classification Robust to Illumination Source Position and Viewpoint

  • Author

    Krishna, Thilakam Vimal Thilak ; Creusere, Charles D. ; Voelz, David G.

  • Author_Institution
    NVIDIA Corp., Santa Clara, CA, USA
  • Volume
    20
  • Issue
    1
  • fYear
    2011
  • Firstpage
    288
  • Lastpage
    292
  • Abstract
    Polarization, a property of light that conveys information about the transverse electric field orientation, complements other attributes of electromagnetic radiation such as intensity and frequency. Using multiple passive polarimetric images, we develop an iterative, model-based approach to estimate the complex index of refraction and apply it to target classification.
  • Keywords
    electromagnetic wave polarisation; electromagnetic waves; electromagnetic radiation; illumination source position; passive polarimetric imagery-based material classification; polarization; target classification; transverse electric field orientation; Index of refraction estimation; pBRDF modeling; polarimetric imaging;
  • fLanguage
    English
  • Journal_Title
    Image Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7149
  • Type

    jour

  • DOI
    10.1109/TIP.2010.2052274
  • Filename
    5483164