• DocumentCode
    1514796
  • Title

    Measuring complex permeability of ferromagnetic thin films using non-50 Ω shorted microstrip method

  • Author

    Wu, Yaowu ; Tang, Zhen ; Xu, Yan ; Zhang, Boming

  • Author_Institution
    Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China (UESTC), Chengdu, China
  • Volume
    46
  • Issue
    12
  • fYear
    2010
  • Firstpage
    848
  • Lastpage
    850
  • Abstract
    A non-50 Ω shorted microstrip method is proposed to measure the complex permeability of ferromagnetic thin film. The proposed method, using a higher characteristic impedance microstrip, achieves a more compact fixture structure and can be applied to a higher operation frequency. The experimental results show that, assuming the discontinuity effect between the coaxial-microstrip connector and the microstrip, the permeability measured using the non-50 Ω shorted microstrip method agrees excellently with that measured using the 50 Ω shorted microstrip method.
  • Keywords
    magnetic permeability measurement; magnetic thin films; microstrip components; coaxial-microstrip connector; complex permeability measurement; ferromagnetic thin films; higher characteristic impedance microstrip; nonshorted microstrip method; resistance 50 ohm;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2010.0464
  • Filename
    5483963