• DocumentCode
    1515876
  • Title

    Estimation of surface roughness parameters from dual-frequency measurements of radar backscattering coefficients

  • Author

    Mo, Tsan ; Wang, James R. ; Schmugge, Thomas J.

  • Author_Institution
    Comput. Sci. Corp., Beltsville, MD, USA
  • Volume
    26
  • Issue
    5
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    574
  • Lastpage
    579
  • Abstract
    A simple model was developed for estimating the surface roughness parameters of a bare soil field. The model uses a set of dual-frequency measurements of the field´s radar backscattering coefficients, which can be matched to calculated results obtained with assumed values for the surface roughness parameters, as represented by the surface height standard deviation σ and its correlation lengths. Scatter plots of measured and calculated radar backscattering coefficients at the C -band (4.25-GHz) frequency versus those at L-band (1.5 GHz) show that it is feasible to estimate the surface roughness parameters using this technique. The estimated values for σ are in excellent agreement with those of measurements. However, there are discrepancies between the estimated and measured values for the correlation length L. For a very rough field, the geometrical optics model could be more appropriate for modeling the C-band data
  • Keywords
    agriculture; geophysical techniques; radar applications; radiowave propagation; remote sensing; soil; 1.5 GHz; 4.25 GHz; C-band; L-band; SHF; UHF; agriculture; bare soil field; dual-frequency; land surface; microwave; radar backscattering coefficients; radar technique; remote sensing; surface roughness parameters; Backscatter; Frequency estimation; Length measurement; Measurement standards; Radar measurements; Radar scattering; Rough surfaces; Soil measurements; Solid modeling; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0196-2892
  • Type

    jour

  • DOI
    10.1109/36.7682
  • Filename
    7682