Fast dynamic-response measurement technique for electrooptic devices based on modified optical sampling

Author

Takara, Hidehiko ; Kawanishi, Satoki ; Saruwatari, Masatoshi

Author_Institution

NTT Transmission Syst. Lab., Kanagawa, Japan

Volume

3

Issue

2

fYear

1991

Firstpage

167

Lastpage

169

Abstract

A fast dynamic-response measurement technique for electrooptic modulators is proposed. Using a gain-switched laser-diode pulse as a strobe, random modulation characteristics including eye-diagrams of wideband LiNbO/sub 3/ modulators were clearly measured with a resolution of about 20 ps. The method is proven to have high temporal resolution, and the limitation of the signal-to-noise ratio experienced by the conventional direct detection method is not encountered. This technique can be applied to the evaluation of other optical devices controlled by electrical signals, such as LiNbO/sub 3 /matrix switches and semiconductor laser amplifier switches.<>

Keywords

electro-optical devices; high-speed optical techniques; lithium compounds; optical modulation; optical variables measurement; electrooptic modulators; eye-diagrams; fast dynamic-response measurement technique; gain-switched laser-diode pulse; high temporal resolution; modified optical sampling; random modulation characteristics; resolution; strobe; wideband LiNbO/sub 3/ modulators; Electrooptic devices; Electrooptic modulators; Measurement techniques; Optical devices; Optical modulation; Pulse measurements; Pulse modulation; Sampling methods; Semiconductor optical amplifiers; Signal resolution;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.76878

Filename

76878