Estimation of system reliability for uncooled optical transmitters using system reliability function

Author

Yoon, Hyun-Jae ; Chung, Nack-Jin ; Choi, Min-Ho ; Park, In-Shik ; Jeong, Jichai

Author_Institution

Dept. of Radio Eng., Korea Univ., Seoul, South Korea

Volume

17

Issue

6

fYear

1999

fDate

6/1/1999 12:00:00 AM

Firstpage

1067

Lastpage

1071

Abstract

This paper investigates the system reliability for 155 Mb/s optical transmitters by deriving a system reliability function from reliability data of each component for transmitters, laser diode, photodiode, optical assembly, and driver IC. The reliability data for each component reliability function have been obtained from accelerated aging test. The reliability parameters such as failure rate, mean time-to-failure (MTTF), standard deviation are obtained from a probability plotting method. From the system reliability function, the MTTF of the optical transmitter at 65°C was estimated to be 47000 h with 95% confidence. In this estimation, we introduced modified lifetime of laser diodes and reliability function of optical assembly

Keywords

ageing; life testing; modules; optical testing; optical transmitters; photodiodes; reliability; semiconductor device testing; semiconductor lasers; 65 C; Mb/s optical transmitters; accelerated aging test; component reliability function; driver IC; failure rate; laser diode; mean time-to-failure; optical assembly; photodiode; probability plotting method; reliability data; standard deviation; system reliability; system reliability function; uncooled optical transmitters; Accelerated aging; Assembly systems; Diode lasers; Integrated circuit testing; Optical devices; Optical transmitters; Photodiodes; Photonic integrated circuits; Reliability; System testing;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.769309

Filename

769309