• DocumentCode
    1517919
  • Title

    Systematic Analysis Methodology for Mobile Phone's Electrostatic Discharge Soft Failures

  • Author

    Kim, Ki Hyuk ; Kim, Yongsup

  • Author_Institution
    Digital Media & Commun. R&D Center, Samsung Electron. Co., Ltd., Suwon, South Korea
  • Volume
    53
  • Issue
    3
  • fYear
    2011
  • Firstpage
    611
  • Lastpage
    618
  • Abstract
    A systematic analysis methodology for mobile phone´s electrostatic discharge (ESD) soft failures is proposed. The proposed analysis methodology consists of two parallel processes: one is the ESD simulation and the other is the ESD characterization of the mobile phone. The ESD simulation models that consist of the ESD generator, the ESD testing setup, and a mobile phone are also developed and their accuracy is experimentally verified. The proposed methodology is applied to design the countermeasures against the ESD soft failure of the slide-type mobile phones and the root causes of the ESD soft failures are analyzed. The RC low-pass filters are designed to improve the ESD immunity of the mobile phone and the ESD simulation results of the improved mobile phone show more than 82% voltage-level reductions of the signals, which cause the ESD soft failures. In order to verify that the reduced voltage levels, actually, solve the problem of ESD soft failures, the improved mobile phone´s ESD immunity is characterized again, and no ESD soft failure is detected.
  • Keywords
    electrostatic discharge; mobile handsets; radiofrequency interference; ESD characterization; ESD generator; ESD immunity; ESD simulation; ESD soft failure; ESD testing setup; RC low-pass filter; electromagnetic interference; electrostatic discharge soft failure; parallel process; slide-type mobile phone; systematic analysis methodology; voltage-level reduction; Batteries; Electrostatic discharge; Generators; Integrated circuit modeling; Mobile communication; Mobile handsets; Testing; Digital circuits; electromagnetic analysis; electromagnetic interference; electrostatic discharge (ESD);
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2011.2143719
  • Filename
    5768072