DocumentCode
1518365
Title
Simulation of the collection properties of CdTe strip detectors
Author
Cola, Adriano ; Quaranta, Fabio ; Caroli, Ezio ; Dusi, Waldes ; Perillo, Eugenio
Author_Institution
IME, CNR, Lecce, Italy
Volume
48
Issue
3
fYear
2001
fDate
6/1/2001 12:00:00 AM
Firstpage
292
Lastpage
295
Abstract
CdTe is an attractive material for X-ray and gamma-ray detectors, but the poor transport properties of holes affect the performance by introducing a low energy tailing in the observed spectra. A possible solution to this problem is to optimize the electrode geometry, for example, by reducing the dimension of the anode with respect to the cathode. In this way, the charge signal in the external circuit is mostly due to the electrons moving toward the anode that is where the weighing field becomes localized. The optimization of the electrode geometry can be approached by a numerical analysis as the problem of charge collection is strictly connected to trapping and detrapping processes, which are difficult to analytically treat in nonuniform electric fields. In this paper, we present a numerical simulator based on a finite difference numerical method (which follows the weighing field approach) and on a Monte-Carlo procedure, which is able to analyze, in two dimensions, the effect of different electrode configurations: single strip, multiple strip, a single strip with a lateral extended cathode, and, for comparison, the uniform geometry. The results are analyzed in terms of the maps of the local charge collection efficiency and their histograms, equivalent to spectra due to high-energy X-rays
Keywords
Monte Carlo methods; finite difference methods; position sensitive particle detectors; semiconductor counters; semiconductor device models; CdTe strip detectors; Monte-Carlo; X-ray detector; cathode; charge collection; detrapping; finite difference; gamma-ray detector; multiple strip; single strip; trapping; weighing field; Anodes; Cathodes; Circuits; Electrodes; Electron traps; Gamma ray detectors; Geometry; Nonuniform electric fields; Numerical analysis; Strips;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.940068
Filename
940068
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