• DocumentCode
    1519650
  • Title

    An Analysis and Survey of the Development of Mutation Testing

  • Author

    Jia, Yue ; Harman, Mark

  • Author_Institution
    Dept. of Comput. Sci., Univ. Coll. London, London, UK
  • Volume
    37
  • Issue
    5
  • fYear
    2011
  • Firstpage
    649
  • Lastpage
    678
  • Abstract
    Mutation Testing is a fault-based software testing technique that has been widely studied for over three decades. The literature on Mutation Testing has contributed a set of approaches, tools, developments, and empirical results. This paper provides a comprehensive analysis and survey of Mutation Testing. The paper also presents the results of several development trend analyses. These analyses provide evidence that Mutation Testing techniques and tools are reaching a state of maturity and applicability, while the topic of Mutation Testing itself is the subject of increasing interest.
  • Keywords
    fault diagnosis; program testing; comprehensive analysis; development trend analysis; empirical results; fault-based software testing technique; mutation testing development; mutation testing technique; mutation testing tool; Automata; Books; Computer languages; Educational institutions; Fault detection; Genetic mutations; History; Java; Programming profession; Software testing; Mutation testing; survey.;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/TSE.2010.62
  • Filename
    5487526