• DocumentCode
    1523254
  • Title

    Equivalent capacitances of coplanar waveguide discontinuities and interdigitated capacitors using a three-dimensional finite difference method

  • Author

    Naghed, Mohsen ; Wolff, Ingo

  • Author_Institution
    Dept. of Electr. Eng., Duisburg Univ., West Germany
  • Volume
    38
  • Issue
    12
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    1808
  • Lastpage
    1815
  • Abstract
    Equivalent capacitances of coplanar waveguide discontinuities on multilayered substrates are calculated using a three-dimensional finite-different method. The application of the method is demonstrated for open ends and gaps in microstrip and coplanar waveguides, as well as for more complicated structures such as interdigitated capacitors. The main advantage of the method is its flexibility in treating multilayered substrates and different conductor configurations. It can therefore be applied to more complicated structures such as interdigitated capacitors, air bridges, and waveguide transitions. The effect of conductor metallization thickness and shielding walls is also taken into account. Good agreement between the calculated data and measurements up to 25 GHz in the case of coplanar structures indicates the validity of the static analysis even for high frequencies
  • Keywords
    capacitance; capacitors; difference equations; equivalent circuits; strip lines; waveguide theory; CPW; air bridges; conductor configurations; conductor metallization thickness; coplanar waveguide discontinuities; equivalent capacitances; gaps; interdigitated capacitors; microstrip; multilayered substrates; open ends; shielding walls; three-dimensional finite difference method; waveguide transitions; Bridges; Capacitance; Capacitors; Conductors; Coplanar waveguides; Frequency measurement; Metallization; Microstrip; Waveguide discontinuities; Waveguide transitions;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.64560
  • Filename
    64560