• DocumentCode
    1525277
  • Title

    Microfabricated silicon solid immersion lens

  • Author

    Fletcher, Daniel A. ; Crozier, Kenneth B. ; Guarini, Kathryn W. ; Minne, Stephen C. ; Kino, Gordon S. ; Quate, Calvin F. ; Goodson, Kenneth E.

  • Author_Institution
    Edward L. Ginzton Lab., Stanford Univ., CA, USA
  • Volume
    10
  • Issue
    3
  • fYear
    2001
  • fDate
    9/1/2001 12:00:00 AM
  • Firstpage
    450
  • Lastpage
    459
  • Abstract
    We present the microfabrication of a solid immersion lens from silicon for scanning near-field optical microscopy. The solid immersion lens (SIL) achieves spatial resolution better than the diffraction limit in air without the losses associated with tapered optical fibers. A 15-μm-diameter SIL is formed by reflowing photoresist in acetone vapor and transferring the shape into single-crystal Si with reactive ion etching. The lens is integrated onto a cantilever for scanning, and a tip is fabricated opposite the lens to localize lens-sample contact. Using the Si SIL, we show that microfabricrated lenses have greater optical transparency and less aberration than conventional lenses by focusing a plane wave of 633-nm light to a spot close to a wavelength in diameter. Microlenses made from absorbing materials can be used when the lens thickness Is comparable to the penetration depth of the light. Tolerance to errors in curvature and thickness is improved in micromachined lenses, because spherical aberrations decrease with lens diameter. We demonstrate scanning near-field optical microscopy with the Si SIL and achieve spatial resolution below the diffraction limit in air by resolving 200-nm lines with 633-nm light
  • Keywords
    aberrations; elemental semiconductors; microlenses; near-field scanning optical microscopy; photoresists; silicon; sputter etching; 15 micron; 633 nm; Si; cantilever; lens diameter; lens-sample contact; microfabrication; microlenses; optical transparency; penetration depth; photoresist; reactive ion etching; scanning near-field optical microscopy; solid immersion lens; spatial resolution; spherical aberrations; Lenses; Optical diffraction; Optical fiber losses; Optical fibers; Optical microscopy; Particle beam optics; Resists; Silicon; Solids; Spatial resolution;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.946806
  • Filename
    946806