• DocumentCode
    1527614
  • Title

    Time-resolved electrical and optical measurements in a plasma display panel

  • Author

    Gottschalk, Jeff R. ; Shvydky, Oleksandr ; Compaan, Alvin D. ; Theodosiou, Constantine E. ; Williamson, William, Jr.

  • Author_Institution
    Dept. of Phys. & Astron., Toledo Univ., OH, USA
  • Volume
    27
  • Issue
    3
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    772
  • Lastpage
    777
  • Abstract
    We have used a commercially available monochrome plasma display panel (PDP) to study the electrical and optical properties of PDPs. The monochrome PDP was filled with helium at a pressure of 0.5 atm with the visible light emission observed directly from the gas discharge. The PDP is driven by an AC voltage source, operating at ~130 V at 50 kHz. With nanosecond resolution we have measured the current in the panel and the spectrally resolved light emission from the panel as a function of applied voltage. This study of a helium-filled conventional PDP is designed to provide data needed for improved modeling calculations of the plasma discharge. The ultimate goal is to achieve improved designs and efficacies for large-screen color PDP´s
  • Keywords
    colour displays; helium; large screen displays; plasma diagnostics; plasma displays; 0.5 atm; 130 V; 50 kHz; AC voltage source; He; He-filled plasma display panel; applied voltage; electrical properties; gas discharge; large-screen color plasma display panel; modeling calculations; monochrome plasma display panel; nanosecond resolution; optical properties; plasma discharge; plasma display panel; spectrally resolved light emission; time-resolved electrical measurements; time-resolved optical measurements; visible light emission; Current measurement; Discharges; Electric variables measurement; Helium; Plasma applications; Plasma displays; Plasma measurements; Plasma properties; Stimulated emission; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.774682
  • Filename
    774682