• DocumentCode
    1527648
  • Title

    Macroparticle reflection from a biased substrate in a vacuum arc deposition system

  • Author

    Keidar, M. ; Beilis, I.I.

  • Author_Institution
    Lawrence Berkeley Lab., CA, USA
  • Volume
    27
  • Issue
    3
  • fYear
    1999
  • fDate
    6/1/1999 12:00:00 AM
  • Firstpage
    810
  • Lastpage
    812
  • Abstract
    The reflection of macroparticles, generated by a vacuum arc, from a substrate biased negatively with respect to the surrounding plasma is considered. Charging of macroparticle in the near-substrate sheath and its influence on the macroparticle motion were taken into account. It was found that macroparticles can be either reflected or attracted to the substrate depending strongly on the ion current density. The possibility of macroparticle reflection increases with negative bias voltage and saturates at about a few hundred volts
  • Keywords
    current density; plasma density; plasma deposition; plasma jets; plasma sheaths; reflection; vacuum arcs; ion current density; macroparticle generation; macroparticle motion; macroparticle reflection; metal plasma jets; near-substrate sheath; negative bias voltage; negatively biased substrate; surrounding plasma; vacuum arc deposition system; Plasma applications; Plasma density; Plasma devices; Plasma measurements; Plasma properties; Plasma sheaths; Plasma transport processes; Reflection; Vacuum arcs; Vacuum systems;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.774687
  • Filename
    774687