Identification and quantification of phases formed during the processing of (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag composite conductors

Author

Merchant, N.N. ; Fischer, A.K. ; Maroni, V.A. ; Carter, W.L. ; Parrella, R.D.

Author_Institution

Argonne Nat. Lab., IL, USA

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

1608

Lastpage

1611

Abstract

Scanning electron microscopy, energy dispersive X-ray analysis (including X-ray dot mapping), X-ray diffraction and computer-based image analysis have been used to study non-superconducting secondary phases that evolve during the processing of (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag composite conductors. These investigations have provided new information and insights about specific alkaline earth cuprates (AECs) and lead-rich phases, We can conclusively identify (Ca,Sr)/sub 2/CuO/sub 3/, (Ca,Sr)/sub 14/Cu/sub 24/O/sub 41/ (14/24), and CuO phases, the alkaline earth plumbates, and a (Bi,Pb)-Sr-Ca-Cu-O 3221 phase with a wide range of Pb/Bi ratios. These techniques also help in differentiating voids from secondary phases and alkaline earth plumbates from the lead-rich 3221 phase.

Keywords

X-ray chemical analysis; X-ray diffraction; bismuth compounds; calcium compounds; composite superconductors; high-temperature superconductors; lead compounds; scanning electron microscopy; silver; strontium compounds; voids (solid); (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag composite conductors; (BiPb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O-Ag; X-ray diffraction; X-ray dot mapping; alkaline earth plumbates; computer-based image analysis; energy dispersive X-ray analysis; lead-rich 3221 phase; nonsuperconducting secondary phases; scanning electron microscopy; voids; Bismuth; Conductors; Dispersion; Earth; Image analysis; Lead compounds; Scanning electron microscopy; Strontium; X-ray diffraction; X-ray imaging;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.620884

Filename

620884