DocumentCode
1528437
Title
Modeling of Rate Error in Interferometric Fiber-Optic Gyroscopes Due to Stress Induced by Moisture Diffusion
Author
Webber, Matthew ; Willig, Reinhardt ; Rackowski, H. ; Dineen, Andrew
Author_Institution
Dept. of Phys. & Dept. of Math., Northeastern Univ., Boston, MA, USA
Volume
30
Issue
14
fYear
2012
fDate
7/15/2012 12:00:00 AM
Firstpage
2356
Lastpage
2362
Abstract
Interferometric fiber-optic gyroscopes exhibit time-dependent rate error patterns during operation due to environmental stress on the fiber coil. Short-term errors, equilibrating on the order of minutes to several hours, are attributed to nonreciprocity due to thermal gradients. Long-term rate errors, equilibrating on the order of days to weeks, have not been thoroughly addressed. In this study, we show that diffusion of moisture into or out of a sense coil can cause long-term rate errors. To calculate this effect, we measured the effect of moisture on the mechanical properties of the optical fiber coating. Using these data, we modeled diffusion in a sense coil with finite-element analysis. The rate error is calculated with an integral that is similar to that used by Shupe and others. A variation in water concentration in the coil due to diffusion causes changes in the properties of the fiber coating. This in turn produces nonreciprocal stresses on the waveguide and leads to a rate error.
Keywords
fibre optic gyroscopes; finite element analysis; internal stresses; light interferometry; moisture; environmental stress; fiber coil; finite element analysis; interferometric fiber-optic gyroscopes; long-term rate errors; mechanical properties; moisture diffusion; nonreciprocal stresses; optical fiber coating; sense coil; thermal gradients; time-dependent rate error patterns; water concentration; Coatings; Coils; Humidity; Moisture; Optical fibers; Stress; Young´s modulus; Coating; Young´s modulus; diffusion coefficient; error; fiber-optic gyroscope; finite-element method (FEM); humidity; stress;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2012.2198045
Filename
6209382
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